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APPLICATION-
SPECIFIC SOLUTIONS:


MEMORY TEST & REPAIR
The industry’s most advanced memory test and repair capabilities.

TEST FOR LOW DPM
Addresses today’s growing quality and time-to-market challenges.

EMBEDDED DRAM SELF-TEST
Comprehensive solution for testing and repairing any 3rd party eDRAMs.

AUTOMOTIVE ELECTRONICS TEST
Solutions for today’s automotive semiconductor.

LogicVision is the leader in enabling highest silicon quality while reducing test costs and time to production.  LogicVision’s BIST (built-in-self-test) solutions for Memory, Logic and SerDes enable single-digit DPM (defects per million) quality levels, improve profit margins by reducing device field returns and test costs, shorten time-to-market and time-to-yield by accelerating silicon bring-up and diagnostics. We make money for our customers.

We enable Silicon Quality at the Right Cost.

NEW DEMO
Silicon Insight Demo
Interactive Silicon Debug and Characterization with Silicon Insight Desktop
Watch now

Be ready for the explosion in embedded memories
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Expect more from your test solution
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Visit us at ITC 2008


ITC 2008

October 28-30, 2008
Santa Clara Convention Center
Booth 314
Santa Clara, California

The Embedded Path to Low DPM and Fast Silicon Bring-Up

Memory Repair Primer: A Guide to Understanding Embedded Memory Repair Options and Issues

Introducing Dragonfly
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